Legal Representation
Attorney
Paul A. Rodriguez
Application History
2 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Jul 25, 2025 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
Jul 25, 2025 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Laser scanning semiconductor inspection systems; electronic apparatus for detecting defects on patterned semiconductor wafers; optical inspection systems for use in the manufacturing of integrated circuits, including logic, high-bandwidth memory (HBM), dynamic random-access memory (DRAM), and 3D NAND devices; semiconductor process monitoring instruments; downloadable software for controlling and analyzing data from wafer inspection systems
Classification
International Classes
009