Legal Representation
Attorney
Carolyn M. Gouges d'Agincourt
Application History
4 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Jul 8, 2025 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
Jul 8, 2025 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Jul 8, 2025 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
Jul 8, 2025 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
X-ray-based test equipment for measuring the Total Ionizing Dose (TID) effect corresponding to the accumulated damage in a semiconductor device caused by prolonged exposure to ionizing radiation such as X-rays, gamma rays, protons, or electrons, in spacecraft electronics, satellites, aircraft and spacecraft electronic systems, nuclear instrumentation, and medical imaging and dosimetry systems
Classification
International Classes
009