Legal Representation
Attorney
Paul A. Rodriguez
Application History
2 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| May 27, 2025 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
| May 27, 2025 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Imaging metrology tools, namely, scientific and electronic imaging instruments for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging
Classification
International Classes
009