Legal Representation
Attorney
Chinhwei Chen
USPTO Deadlines
Next Deadline
154 days remaining
NOA E-Mailed - SOU Required
Due Date
July 06, 2026
Extension Available
Until January 06, 2027
Application History
15 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jan 6, 2026 | NOAM | E | NOA E-MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Nov 11, 2025 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Nov 11, 2025 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Nov 5, 2025 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| Oct 15, 2025 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Oct 14, 2025 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Oct 9, 2025 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Oct 9, 2025 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Sep 11, 2025 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Sep 11, 2025 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Sep 11, 2025 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Aug 28, 2025 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jul 11, 2025 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Mar 31, 2025 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
| Mar 31, 2025 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Probes for scientific purposes and for use in the measurement and testing of semiconductors; Probe cards for semiconductor testing; Probe cards for integrated circuit testing; Probes for testing integrated circuits; Microscopes
Class 042
Product research and development; Technological research in the field of microscopy; Engineering services in the field of microscopy, probes and probe cards, namely, technical project planning and engineering design services in the field of microscopy, probes, and probe cards; Technical writing; Scientific analysis of the measurements of semiconductor components; Scientific analysis of the measurements of integrated circuits; Scientific analysis of the measurements of electronic components; Scientific analysis of the measurements of microelectronic components; Scientific analysis of the measurements of nano electronic components; Scientific analysis of the measurements of angstrom electronic components; Scientific analysis of the measurements of passive and active electronic components; Integrated circuit testing and analysis service for scientific research purposes; Scientific analysis of the measurements of very-large-scale integrated circuits; Electronic components testing and analysis service for scientific research purposes; Research in the area of semiconductor processing technology; Research in the field of physics; Chemical analysis; Chemical research; Material testing and analysis
Classification
International Classes
009
042