QD

QUANTUM SENSORS; SENSORS FOR MEASURING INSTRUMENTS FOR QUANTUM SENSING IN CHIP TESTING, NOT FOR MEDICAL USE; DOWNLOADABLE SENSORY SOFTWARE FOR CHIP TESTING; SENSORS, DETECTORS AND MONITORING INSTRUMENTS, NAMELY, QUANTUM SENSORS, DETECTORS AND MONITORING INSTRUMENTS FOR CHIP TESTING; SENSORS, NAMELY, ELECTRONIC SENSORS FOR MEASURING CHIPS, OTHER THAN FOR MEDICAL USE; SENSOR CONTROLLERS, NAMELY, SENSORS FOR CHIP TESITNG; SENSORS FOR REAL TIME DATA INPUT APPARATUS, NAMELY, QUANTUM SENSORS FOR CHIP TESITNG; SENSORS FOR REAL TIME DATA OUTPUT APPARATUS, NAMELY, QUANTUM SENSORS FOR CHIP TESTING; MATERIALS FOR QUANTUM DETECTION AND QUANTUM COMPUTING, NAMELY, ARTIFICIAL DIAMONDS; MATERIALS FOR QUANTUM SENSING AND QUANTUM COMPUTING, NAMELY, ARTICICIAL DIAMONDS; MATERIALS FOR QUANTUM DETECTION AND COMPUTING, NAMELY, ARTIFICIAL DIAMONDS; SEMICONDUCTORS; SEMICONDUCTOR TESTING APPARATUS; INTEGRATED CIRCUITS; TESTING AND QUALITY CONTROL DEVICES, NAMELY, QUANTUM SENSING DEVICES FOR CHIP TESTING; MAGNETIC SENSORS FOR CHIP TESTING; MAGNETIC FLUX SENSORS FOR CHIP TESTING; MAGNETIC OBJECT DETECTORS; SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, DIAGNOSTIC APPARATUS FOR CHIP TESTING, NOT FOR MEDICAL PURPOSES; TEST PROBE ASSEMBLIES FOR INTEGRATED CIRCUITS; TESTING APPARATUS AND INSTRUMENTS FOR CHIPS; TESTING APPARATUS FOR CHECKING ELECTRONIC DEVICES, NAMELY, CHIPS; TESTING APPARATUS FOR CHECKING OPTICAL DEVICES, NAMELY, PROJECTION OPTICS AND LENSES; TESTING APPARATUS FOR ELECTRONIC EQUIPMENT, NAMELY, CHIPS; TESTING APPARATUS FOR TESTING PRINTED CIRCUIT BOARDS; DETECTING APPARATUS AND INSTRUMENTS, NAMELY, QUANTUM SENSING APPARATUS AND INSTRUMENTS; DETECTION APPARATUS, NAMELY, QUANTUM SENSING APPARATUS; MEASURING SENSORS, NAMELY, QUANTUM SENSORS; OPTICAL SENSORS; ELECTRIC SENSORS; ELECTRICAL SENSORS; ELECTRO-OPTICAL SENSORS; ELECTRIC CURRENT SENSORS; ELECTRICAL LEAK DETECTION HARDWARE WITH EMBEDDED OPERATING SYSTEM SOFTWARE; LASER DETECTORS FOR CHIP TESTING; LASER MEASURING SYSTEMS; LASERS FOR MEASURING; LASERS FOR MEASURING PURPOSES; LASER SENSORS CHIP TESTING; MICROSCOPE; MICROSCOPE LENSES; MICROSCOPE OBJECTIVES; FLOURESCENCE QUANTUM MICROSCOPE; MICROSCOPE ILLUMINATING DEVICES; LENSES FOR MICROSCOPES; TURNTABLES BEING PARTS OF MICROSCOPES; OPTICAL MICROSCOPES FOR BIOLOGICAL PURPOSES; OPTICAL MICROSCOPES FOR INDUSTRIAL PUR-POSES; OPTICAL MICROSCOPES FOR INDUSTRIAL USE; OPTICAL MICROSCOPES FOR MATERIALS TESTING; OPTICAL MICROSCOPES FOR SCIENTIFIC PURPOSES; OPTICAL MICROSCOPES FOR TESTING OF MATERIALS; NON-DESTRUCTIVE TESTING APPARATUS, NAMELY, MAGNETIC CURRENT IMAGING APPARATUS; REAL-TIME DATA PROCESSING APPA-RATUS; TEMPERATURE MONITORS FOR SCIENTIFIC USE; TEMPERATURE MONITORS FOR INDUSTRIAL USE; TEMPERATURE SENSING APPARATUS FOR SCIENTIFIC USE; TEMPERATURE SENSITIVE TEST-ING APPARATUS FOR INDUSTRIAL USE; TEMPERATURE SENSITIVE TESTING APPARATUS FOR SCIEN-TIFIC USE; THERMAL SENSORS, NAMELY, THERMOSTATS; HEAT SENSING IDENTIFICATION INDICATORS, NAMELY, HEAT SENSORS, NOT FOR MEDICAL USE

TECHNICAL CONSULTANCY IN RELATION TO THE PRODUCTION OF CHIPS; ADVISORY SERVICES RELATING TO SCIENTIFIC INSTRUMENTS, NAMELY, QUANTUM SENSING FOR ADVANCED CHIP TESTING; ADVISORY SERVICES RELATING TO TECHNOLOGICAL RESEARCH IN THE FIELD OF QUANTUM SENSING; ADVISORY SERVICES RELATING TO SCIENCE; ADVISORY SERVICES RELATING TO SCIENTIFIC RESEARCH; CALIBRATION OF INSTRUMENTS; CALIBRATION MEASURING SERVICES; CALIBRATION SERVICES; CALIBRATION SERVICES RELATING TO ANALYTICAL APPARATUS; CALIBRATION SERVICES RELATING TO ELECTRONIC APPARATUS; COMPUTER AIDED INDUSTRIAL ANALYSIS SERVICES FOR CHIP TESTING; CONDUCTING INDUSTRIAL TESTS, NAMELY, CHIP TESTING; CONSULTANCY IN THE FIELD OF SCIENTIFIC RESEARCH IN THE FIELD OF QUANTUM SENSING; CONSULTANCY IN THE FIELD OF INDUSTRIAL RESEARCH IN THE FIELD OF QUANTUM SENSING; CONSULTANCY IN THE FIELD OF TECHNOLOGICAL RESEARCH IN THE FIELD OF QUANTUM SENSING; DESIGN AND DEVELOPMENT OF ENGINEERING PRODUCTS; DESIGN AND DEVELOPMENT OF INDUSTRIAL PRODUCTS; DEVELOPMENT OF INDUSTRIAL PROCESSES; DEVELOPMENT OF NEW PRODUCTS FOR OTHERS; DEVELOPMENT OF NEW TECHNOLOGY FOR OTHERS; DEVELOPMENT OF TESTING METHODS; SCIENTIFIC RESEARCH IN THE FIELD OF QUANTUM TECHNOLOGY; RESEARCH IN THE FIELD OF QUANTUM PRECISION MEASURING; CONSULTANCY AND RESEARCH IN THE FIELD OF QUANTUM TECHNOLOGY; CONSULTANCY AND RE-SEARCH IN THE FIELD OF QUANTUM ENGINEERING; DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE RELATING TO QUANTUM TECHNOLOGY; DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE RELATING TO QUANTUM ENGINEERING; MAINTENANCE AND UPDATING OF SOFTWARE RELATING TO QUANTUM TECHNOLOGY; RESEARCH IN THE AREA OF SEMICONDUCTOR PROCESSING TECHNOLOGY; RESEARCH IN THE FIELD OF QUANTUM SIMULATION; SCIENTIFIC AND TECHNOLOGICAL SERVICES RELATING TO QUANTUM MATERIALS; SCIENTIFIC RE-SEARCH IN THE FIELD OF QUANTUM ENGINEERING; SCIENTIFIC AND TECHNOLOGICAL SERVICES RE-LATING TO QUANTUM RESEARCH; MAINTENANCE AND UPDATING OF SOFTWARE RELATING TO QUANTUM ENGINEERING; ENGINEERING WORK, BEING QUANTUM ENGINEERING; EXPERT OPINION RELATING TO TECHNOLOGY, NAMELY, QUANTUM TESTING TECHNOLOGY; EXPERT ADVICE RELATING TO TECHNOLOGY, NAMELY, QUANTUM TESTING TECHNOLOGY; MACHINE CONDITION MONITORING, NAMELY, MICROSCOPES AND TESTING MACHINES; MEASUREMENT SERVICES FOR CHIP TESTING; SCIENCE AND TECHNOLOGY SERVICES, NAMELY, QUANTUM SENSING; SCIENTIFIC SERVICES AND DESIGN, NAMELY, QUANTUM SENSING; SCIENTIFIC SERVICES AND RESEARC, NAMELY, QUANTUM SENSING; SCIENTIFIC TECHNOLOGICAL SERVICES, NAMELY, QUANTUM SENSING; SOFTWARE AS A SERVICE FEATURING SOFTTWARE FOR QUANTUM SENSING; SOFTWARE AS A SERVICE (SAAS) SERVICES FEATURING SOFTWARE FOR QUANTUM SENSING; SERVICES FOR THE DEVELOPMENT OF METHODS OF TESTING IN THE NATURE OF NON-DESTRUCTABLE CHIP TESTING; TECHNICAL DATA ANALYSIS, NAMELY, QUANTUM PRECISION MEASURING; TECHNICAL DATA ANALYSIS SERVICES, NAMELY, QUANTUM PRECISION MEASURING; QUALITY MANAGEMENT SREVICES, NAMELY, QUALITY EVALUATIONA ND ANALYSIS, QUALITY ASSURANCE, AND QUALITY CONTROL, IN THE FIELD OF QUANTUM CHIP TECHING