Legal Representation
Attorney
Jeremy P. Oczek
USPTO Deadlines
Application History
24 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jan 28, 2026 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| Jan 12, 2026 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Jan 8, 2026 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Jan 8, 2026 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Jan 8, 2026 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Jan 6, 2026 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Jan 6, 2026 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Jan 6, 2026 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Jan 5, 2026 | ZZZX | Z | PREVIOUS ALLOWANCE COUNT WITHDRAWN | Loading... |
| Sep 23, 2025 | PBCR | Z | WITHDRAWN FROM PUB - OG REVIEW QUERY | Loading... |
| Aug 28, 2025 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Aug 28, 2025 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
| Aug 28, 2025 | GNEN | O | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | Loading... |
| Aug 28, 2025 | GNEA | F | EXAMINERS AMENDMENT E-MAILED | Loading... |
| Aug 28, 2025 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
| Aug 18, 2025 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Aug 18, 2025 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Aug 18, 2025 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| May 22, 2025 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| May 22, 2025 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| May 22, 2025 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| May 20, 2025 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Nov 27, 2024 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Nov 27, 2024 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Equipment in the nature of metrology systems consisting of wafer probers, microscopes, nanopositioners for moving the probe cards and electronic components, probe cards, automatic test equipment, and downloadable automation software with computer vision capability, used to test thin film materials, semiconductors, conductors, wafers, and semiconductor chips, namely, chiplets being integrated circuits and advanced packages being multiple semiconductor chips and electronic components being semiconductor wafers, switches, and integrated circuits integrated together
Classification
International Classes
009