Legal Representation
Attorney
Lucas S. Michels
USPTO Deadlines
Next Deadline
3 days remaining
Examiner's Amendment Completed
Due Date
August 07, 2025
Application History
14 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jul 24, 2025 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Jul 23, 2025 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
| Jul 23, 2025 | GNEA | F | EXAMINERS AMENDMENT E-MAILED | Loading... |
| Jul 23, 2025 | GNEN | O | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | Loading... |
| Jul 23, 2025 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
| Jun 27, 2025 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Jun 27, 2025 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Jun 27, 2025 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Mar 27, 2025 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Mar 27, 2025 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Mar 27, 2025 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Mar 11, 2025 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Mar 10, 2025 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Aug 28, 2024 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Inspection machine for the physical inspection of secondary battery charging machines; inspection machine for the physical inspection of liquid crystal displays; inspection machine for the physical inspection of light emitting diode lighting fixtures; optical inspection machine; surface defect testing machine and inspection machine for the physical inspection of surface defects on metal sheets; machines for the visual inspection of cropping on metal sheets; downloadable computer software for machine learning and data analysis in the field of artificial intelligence; recorded computer software for machine learning and data analysis in the field of artificial intelligence; inspection machine for the physical inspection of semiconductor materials, namely, semiconductor test sockets; inspection machine for the visual inspection of secondary battery charging machines; inspection machine for the electrical inspection of secondary battery machines; inspection machine for the physical inspection of secondary battery machine parts, namely, secondary battery cans being housings specially designed for secondary batteries and secondary battery caps
Additional Information
Design Mark
The mark consists of the stylized word "ENSCAPE" written horizontally with the stylized words "MACHINE VISION & AI LAB" written horizontally directly below.
Color Claim
Color is not claimed as a feature of the mark.
Pseudo Mark
ENSCAPE MACHINE VISION AND AI LAB
Classification
International Classes
009
Disclaimers
The following terms have been disclaimed and are not claimed as part of the trademark:
Specific Disclaimer
"MACHINE VISION & AI LAB"