Legal Representation
Attorney
Kenya Williams
USPTO Deadlines
Next Deadline
19 days remaining
NOA E-Mailed - SOU Required
Due Date
February 26, 2026
Extension Available
Until August 26, 2026
Application History
14 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Aug 26, 2025 | NOAM | E | NOA E-MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Jul 1, 2025 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Jul 1, 2025 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Jun 25, 2025 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| May 27, 2025 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| May 23, 2025 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| May 23, 2025 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| May 23, 2025 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Feb 23, 2025 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Feb 23, 2025 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Feb 23, 2025 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Dec 26, 2024 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Dec 23, 2024 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Jun 10, 2024 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for semiconductor analysis
Classification
International Classes
009