Legal Representation
Attorney
Michael B. Lasky
USPTO Deadlines
Application History
10 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| May 5, 2025 | MAB6 | E | ABANDONMENT NOTICE E-MAILED - NO USE STATEMENT FILED | Loading... |
| May 5, 2025 | ABN6 | S | ABANDONMENT - NO USE STATEMENT FILED | Loading... |
| Oct 1, 2024 | NOAM | E | NOA E-MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Aug 6, 2024 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Aug 6, 2024 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Jul 17, 2024 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| Jul 1, 2024 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| May 21, 2024 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Oct 12, 2023 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Oct 2, 2023 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus
Class 042
Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips; design and development of probe arrays for testing integrated circuit chips
Classification
International Classes
009
042