Legal Representation
Attorney
Joseph Shapiro
USPTO Deadlines
Next Deadline
1779 days remaining
Section 8 (6-Year) Declaration Due (Based on registration date 2024-06-04)
Due Date
June 04, 2030
Grace Period Ends
December 04, 2030
Additional deadlines exist. Contact your attorney for complete deadline information.
Application History
17 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jun 4, 2024 | NRCC | E | NOTICE OF REGISTRATION CONFIRMATION EMAILED | Loading... |
| Jun 4, 2024 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
| Mar 19, 2024 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Mar 19, 2024 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Feb 28, 2024 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| Feb 28, 2024 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Feb 13, 2024 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Feb 9, 2024 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
| Feb 9, 2024 | GNEN | O | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | Loading... |
| Feb 9, 2024 | GNEA | F | EXAMINERS AMENDMENT E-MAILED | Loading... |
| Feb 9, 2024 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
| Feb 6, 2024 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jun 12, 2023 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| May 26, 2023 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
| May 26, 2023 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
| May 26, 2023 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
| May 16, 2023 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Probes for testing semiconductors; Probes for testing integrated circuits; Downloadable computer software for use in operating semiconductor testing machines; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal
First Use Anywhere:
Aug 14, 2014
First Use in Commerce:
Aug 14, 2014
Classification
International Classes
009