Legal Representation
Attorney
Joseph Shapiro
USPTO Deadlines
Next Deadline
1618 days remaining
Section 8 Declaration Due (Principal Register) (Based on registration date 20240604)
Due Date
June 04, 2030
Grace Period Ends
December 04, 2030
Additional deadlines exist. Contact your attorney for complete deadline information.
Application History
17 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jun 4, 2024 | NRCC | E | NOTICE OF REGISTRATION CONFIRMATION EMAILED | Loading... |
| Jun 4, 2024 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
| Mar 19, 2024 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Mar 19, 2024 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Feb 28, 2024 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| Feb 28, 2024 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Feb 13, 2024 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Feb 9, 2024 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
| Feb 9, 2024 | GNEN | O | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | Loading... |
| Feb 9, 2024 | GNEA | F | EXAMINERS AMENDMENT E-MAILED | Loading... |
| Feb 9, 2024 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
| Feb 6, 2024 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jun 12, 2023 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| May 26, 2023 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
| May 26, 2023 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
| May 26, 2023 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
| May 16, 2023 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Probes for testing semiconductors; Probes for testing integrated circuits; Downloadable computer software for use in operating semiconductor testing machines; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal
First Use Anywhere:
Aug 14, 2014
First Use in Commerce:
Aug 14, 2014
Classification
International Classes
009