Legal Representation
Attorney
Heather J. Kliebenstein
USPTO Deadlines
Next Deadline
1288 days remaining
Section 8 (6-Year) Declaration Due (Based on registration date 2023-05-16)
Due Date
May 16, 2029
Grace Period Ends
November 16, 2029
Additional deadlines exist. Contact your attorney for complete deadline information.
Application History
16 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| May 16, 2023 | NRCC | E | NOTICE OF REGISTRATION CONFIRMATION EMAILED | Loading... |
| May 16, 2023 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
| Apr 11, 2023 | SUNA | E | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED | Loading... |
| Apr 10, 2023 | CNPR | P | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED | Loading... |
| Mar 10, 2023 | SUPC | I | STATEMENT OF USE PROCESSING COMPLETE | Loading... |
| Mar 3, 2023 | AITU | A | CASE ASSIGNED TO INTENT TO USE PARALEGAL | Loading... |
| Feb 10, 2023 | IUAF | S | USE AMENDMENT FILED | Loading... |
| Feb 10, 2023 | EISU | I | TEAS STATEMENT OF USE RECEIVED | Loading... |
| Aug 16, 2022 | NOAM | E | NOA E-MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Jun 21, 2022 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Jun 21, 2022 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Jun 1, 2022 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| May 17, 2022 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| May 2, 2022 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Mar 21, 2022 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Mar 18, 2022 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Inspection and metrology equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of something thereon; Inspection and metrology equipment and devices, namely, equipment and devices that measure the 3D dimensions and overlay of features in semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media
First Use Anywhere:
Jul 16, 1997
First Use in Commerce:
Jul 16, 1997
Classification
International Classes
009