Legal Representation
Attorney
Heather J. Kliebenstein
Application History
5 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Mar 25, 2022 | ABN1 | O | ABANDONMENT - EXPRESS MAILED | Loading... |
Mar 25, 2022 | MAB1 | E | ABANDONMENT NOTICE E-MAILED - EXPRESS ABANDONMENT | Loading... |
Mar 24, 2022 | EXAR | I | TEAS EXPRESS ABANDONMENT RECEIVED | Loading... |
Mar 16, 2022 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
Mar 15, 2022 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials; Metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; Metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; Metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; Optical inspection equipment for 2D and 3D inspection of semiconductor materials; Metrology instruments metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology
First Use Anywhere:
0
First Use in Commerce:
0
Class 042
Software for the semiconductor industry, namely, software for identifying defects in semiconductor structures, software for identifying semiconductor fabrication process excursions, software for recording and reviewing defects in semiconductors structures, software for identifying root causes of defects in semiconductor structures, and software for controlling and monitoring semiconductor fabrication equipment
First Use Anywhere:
0
First Use in Commerce:
0
Additional Information
Design Mark
The mark consists of the words "ONTO INNOVATION" in red, lower case letters. The word "ONTO" is in bold, stylized letters with the word "INNOVATION" above the second "O" in the word "ONTO".
Color Claim
The color(s) red is/are claimed as a feature of the mark.
Classification
International Classes
009
042