Legal Representation
Attorney
Winfield B. Martin
USPTO Deadlines
Application History
13 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Mar 29, 2023 | MAB2 | E | ABANDONMENT NOTICE E-MAILED - FAILURE TO RESPOND | Loading... |
| Mar 29, 2023 | MAB2 | O | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | Loading... |
| Mar 29, 2023 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Sep 19, 2022 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
| Sep 19, 2022 | EWAF | I | TEAS WITHDRAWAL OF ATTORNEY RECEIVED-FIRM RETAINS | Loading... |
| Sep 19, 2022 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
| Sep 19, 2022 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
| Sep 14, 2022 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Sep 14, 2022 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Sep 14, 2022 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Sep 13, 2022 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Dec 7, 2021 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Dec 7, 2021 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Probes for testing integrated circuits and semiconductor devices; probes for use in connection with inspection of semiconductor devices and integrated circuits; probes for the measurement of electronic signals; probes for inspecting integrated circuits and semiconductor devices; testing and inspecting apparatus for use in connection with semiconductors and integrated circuits; probes for scientific purposes
First Use Anywhere:
0
First Use in Commerce:
0
Class 040
Custom manufacturing of probes for testing semiconductor devices, probes for testing integrated circuits, and probes for testing electronic signals; custom additive manufacturing of probes for others; custom 3-D printing for others
First Use Anywhere:
0
First Use in Commerce:
0
Class 042
Custom design and engineering services of probes for use in testing integrated circuits and semiconductor devices; consulting services in the field of testing of electronic components and electronic systems; technical consulting services in the field of testing of electronic components and electronic systems
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009
040
042