Legal Representation
Attorney
Paul A. Rodriguez
USPTO Deadlines
Application History
15 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Apr 14, 2023 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Apr 14, 2023 | MAB2 | O | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | Loading... |
| Apr 14, 2023 | MAB2 | E | ABANDONMENT NOTICE E-MAILED - FAILURE TO RESPOND | Loading... |
| Jan 2, 2023 | CNFR | R | FINAL REFUSAL WRITTEN | Loading... |
| Jan 2, 2023 | GNFR | O | FINAL REFUSAL E-MAILED | Loading... |
| Jan 2, 2023 | GNFN | O | NOTIFICATION OF FINAL REFUSAL EMAILED | Loading... |
| Dec 30, 2022 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Dec 30, 2022 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Dec 30, 2022 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Sep 7, 2022 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Sep 7, 2022 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Sep 7, 2022 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Aug 31, 2022 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Nov 24, 2021 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Nov 23, 2021 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Computer hardware for testing, inspecting, characterizing and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, semiconductor wafers and lithographic photomasks; downloadable and recorded computer software for testing, inspecting, characterizing and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, printed circuit boards, semiconductor wafers, and lithographic photomasks; computer hardware for electrical testing for backplane and mass transfer processes for microLED display manufacturing and related services; downloadable and recorded computer software for electrical testing for backplane and mass transfer processes for microLED display manufacturing and related services; display apparatus namely, flat panel displays and associated components; electronic devices for monitoring photoresist processes; detectors, namely, detectors for the detection of defects of semiconductors, integrated circuits, microelectronics, printed circuit boards, semiconductor wafers, and photomasks; measuring apparatus, namely, apparatus for measuring the physical and electrical properties of semiconductors, integrated circuits, microelectronics, printed circuit boards, semiconductor wafers, and photomasks; measuring instruments namely instruments for measuring the physical and electrical properties of semiconductors, integrated circuits, microelectronics, semiconductor wafers, and photomasks; electricity meters; lasers, not for medical purposes; probes for scientific purposes; optical apparatus and instruments except for glasses and photographic apparatus, namely, optical inspection apparatus for semiconductors, semiconductor wafers, printed circuit boards, and flat panel displays
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009