Legal Representation
Attorney
William S. Fultz
USPTO Deadlines
Next Deadline
420 days remaining
Section 8 (6-Year) Declaration Due (Based on registration date 2020-09-08)
Due Date
September 08, 2026
Grace Period Ends
March 08, 2027
Additional deadlines exist. Contact your attorney for complete deadline information.
Application History
17 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Nov 30, 2023 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
| Nov 30, 2023 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
| Nov 30, 2023 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
| Sep 8, 2020 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
| Jun 23, 2020 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Jun 23, 2020 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
| Jun 3, 2020 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
| May 14, 2020 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| May 13, 2020 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| May 12, 2020 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| May 12, 2020 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Nov 15, 2019 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Nov 15, 2019 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Nov 15, 2019 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Nov 12, 2019 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Aug 28, 2019 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Aug 16, 2019 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
Detailed Classifications
Class 009
Analytical instruments and apparatus, namely confocal microscope, micro-Raman spectrograph or microscope, photoluminescence microscope, Fourier transform infrared microscope, spectroscopic ellipsometer, scanning probe microscope, atomic force microscope, photo induced force microscope, Kelvin probe microscope, scanning near-field optical microscope, the analyses occurring over a temperature range from 10mK to 1000K for research and characterization in laboratories and industrial manufacturing facilities, including the measurements of confocal microscopy, micro-Raman spectroscopy, photoluminescence microscopy, Fourier Transform Infrared Microscopy (FTIR), spectroscopic ellipsometry (SE), transport and microwave RF Measurements, scanning probe microscopies including its many modalities such as Atomic Force Microscopy, Photo induced Force Microscopy, Kelvin Probe Microscopy, scanning near-field optical microscopy, the analyses occurring over a temperature range from 10mK to 1000K
First Use Anywhere:
Aug 6, 2019
First Use in Commerce:
Aug 6, 2019
Additional Information
Pseudo Mark
MICRO REVEAL
Classification
International Classes
009