WAFER TRANSLATOR

Serial Number 87455902
602

Registration Progress

Application Filed
May 18, 2017
Under Examination
Approved for Publication
Published for Opposition
Registered

Trademark Image

WAFER TRANSLATOR

Basic Information

Serial Number
87455902
Filing Date
May 18, 2017
Abandonment Date
September 24, 2018
Drawing Code
4000

Status Summary

Current Status
Inactive
Status Code
602
Status Date
Oct 29, 2018
Classes
009

Rights Holder

Translarity, Inc.

03
Address
46575 Fremont Blvd.
Fremont, CA 94538

Ownership History

Translarity, Inc.

Original Applicant
03
Fremont, CA

Legal Representation

Attorney
Everett E. Fruehling

USPTO Deadlines

All Deadlines Cleared

All 3 deadline(s) have been cleared by subsequent events. No active deadlines at this time.

Application History

16 events
Date Code Type Description Documents
Oct 29, 2018 ABN2 O ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE Loading...
Oct 29, 2018 MAB2 O ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND Loading...
Mar 21, 2018 CNFR R FINAL REFUSAL WRITTEN Loading...
Mar 21, 2018 GNFR O FINAL REFUSAL E-MAILED Loading...
Mar 21, 2018 GNFN O NOTIFICATION OF FINAL REFUSAL EMAILED Loading...
Feb 22, 2018 TEME I TEAS/EMAIL CORRESPONDENCE ENTERED Loading...
Feb 21, 2018 TROA I TEAS RESPONSE TO OFFICE ACTION RECEIVED Loading...
Feb 21, 2018 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Sep 28, 2017 COAR I TEAS CHANGE OF OWNER ADDRESS RECEIVED Loading...
Sep 28, 2017 CHAN I APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Loading...
Aug 21, 2017 CNRT R NON-FINAL ACTION WRITTEN Loading...
Aug 21, 2017 GNRT F NON-FINAL ACTION E-MAILED Loading...
Aug 21, 2017 GNRN O NOTIFICATION OF NON-FINAL ACTION E-MAILED Loading...
Aug 17, 2017 DOCK D ASSIGNED TO EXAMINER Loading...
May 24, 2017 NWOS I NEW APPLICATION OFFICE SUPPLIED DATA ENTERED Loading...
May 22, 2017 NWAP I NEW APPLICATION ENTERED Loading...

Detailed Classifications

Class 009
Probes for testing semiconductors; probes for testing integrated circuits; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal
First Use Anywhere: 0
First Use in Commerce: 0

Classification

International Classes
009

Disclaimers

The following terms have been disclaimed and are not claimed as part of the trademark:
General Disclaimer
"WAFER"