Legal Representation
Attorney
Heather J. Kliebenstein
USPTO Deadlines
Application History
23 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Oct 28, 2020 | ASGN | I | AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP | Loading... |
| Apr 9, 2018 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Apr 9, 2018 | MAB2 | O | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | Loading... |
| Sep 5, 2017 | CNFR | R | FINAL REFUSAL WRITTEN | Loading... |
| Sep 5, 2017 | GNFR | O | FINAL REFUSAL E-MAILED | Loading... |
| Sep 5, 2017 | GNFN | O | NOTIFICATION OF FINAL REFUSAL EMAILED | Loading... |
| Aug 7, 2017 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Aug 7, 2017 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Aug 3, 2017 | ALIE | A | ASSIGNED TO LIE | Loading... |
| Jul 6, 2017 | NREV | E | NOTICE OF REVIVAL - E-MAILED | Loading... |
| Jul 5, 2017 | PROA | I | TEAS PETITION TO REVIVE RECEIVED | Loading... |
| Jul 5, 2017 | PETG | O | PETITION TO REVIVE-GRANTED | Loading... |
| Jul 5, 2017 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| May 8, 2017 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| May 8, 2017 | MAB2 | O | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | Loading... |
| Sep 27, 2016 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Sep 27, 2016 | GNRT | F | NON-FINAL ACTION E-MAILED | Loading... |
| Sep 27, 2016 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
| Sep 20, 2016 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jul 20, 2016 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
| Jul 20, 2016 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
| Jul 1, 2016 | NWAP | I | NEW APPLICATION ENTERED | Loading... |
| Jul 1, 2016 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
Detailed Classifications
Class 009
Computer software for analysis and visualization of process, metrology, inspection, test, and design data pertaining to semiconductor manufacturing
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009