XHEMIS

Serial Number 79273177
Registration 6110185
700

Registration Progress

Application Filed
Oct 3, 2019
Under Examination
Approved for Publication
May 12, 2020
Published for Opposition
May 12, 2020
Registered
Jul 28, 2020

Attorney Assistance

Section 8 (6-Year) Declaration Due (Based on registration date 2020-07-28)
Due: Jul 28, 2026 265 days

Trademark Image

XHEMIS

Basic Information

Serial Number
79273177
Registration Number
6110185
Filing Date
October 3, 2019
Registration Date
July 28, 2020
Published for Opposition
May 12, 2020
Drawing Code
4

Status Summary

Current Status
Active
Status Code
700
Status Date
Jul 28, 2020
Registration
Registered
Classes
009

Rights Holder

Rigaku Corporation

03
Address
3-9-12, Matsubara-cho,
Akishima-shi; Tokyo 196-8666
JP

Ownership History

Rigaku Corporation

Original Applicant
03
JP

Rigaku Corporation

Owner at Publication
03
JP

Rigaku Corporation

Original Registrant
03
JP

Legal Representation

Attorney
Leigh Ann Lindquist

USPTO Deadlines

Next Deadline
265 days remaining
Section 8 (6-Year) Declaration Due (Based on registration date 2020-07-28)
Due Date
July 28, 2026
Grace Period Ends
January 28, 2027
Additional deadlines exist. Contact your attorney for complete deadline information.

Application History

36 events
Date Code Type Description Documents
Jul 28, 2025 REM3 E COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED Loading...
Dec 6, 2020 FINO P FINAL DECISION TRANSACTION PROCESSED BY IB Loading...
Nov 17, 2020 FICS P FINAL DISPOSITION NOTICE SENT TO IB Loading...
Nov 17, 2020 FIMP P FINAL DISPOSITION PROCESSED Loading...
Oct 28, 2020 FICR P FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB Loading...
Jul 28, 2020 R.PR A REGISTERED-PRINCIPAL REGISTER Loading...
May 12, 2020 NPUB E OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED Loading...
May 12, 2020 PUBO A PUBLISHED FOR OPPOSITION Loading...
Apr 22, 2020 NONP E NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED Loading...
Apr 1, 2020 CNSA O APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Mar 23, 2020 XAEC I EXAMINER'S AMENDMENT ENTERED Loading...
Mar 23, 2020 CNEA R EXAMINERS AMENDMENT -WRITTEN Loading...
Mar 23, 2020 GNEN O NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED Loading...
Mar 23, 2020 GNEA O EXAMINERS AMENDMENT E-MAILED Loading...
Mar 17, 2020 ARAA I ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED Loading...
Mar 17, 2020 REAP I TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED Loading...
Mar 17, 2020 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
Mar 17, 2020 ECDR I TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS Loading...
Mar 17, 2020 ARAA I ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED Loading...
Mar 17, 2020 COAR I TEAS CHANGE OF OWNER ADDRESS RECEIVED Loading...
Mar 17, 2020 CHAN I APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Loading...
Mar 17, 2020 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
Mar 17, 2020 ECDR I TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS Loading...
Mar 17, 2020 CHAN I APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Loading...
Mar 17, 2020 REAP I TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED Loading...
Mar 17, 2020 COAR I TEAS CHANGE OF OWNER ADDRESS RECEIVED Loading...
Feb 22, 2020 RFNT P REFUSAL PROCESSED BY IB Loading...
Feb 5, 2020 RFCS P NON-FINAL ACTION MAILED - REFUSAL SENT TO IB Loading...
Feb 5, 2020 RFRR P REFUSAL PROCESSED BY MPU Loading...
Jan 14, 2020 RFCR E NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW Loading...
Jan 13, 2020 CNRT R NON-FINAL ACTION WRITTEN Loading...
Jan 7, 2020 DOCK D ASSIGNED TO EXAMINER Loading...
Dec 17, 2019 MAFR O APPLICATION FILING RECEIPT MAILED Loading...
Dec 13, 2019 NWOS I NEW APPLICATION OFFICE SUPPLIED DATA ENTERED Loading...
Dec 12, 2019 LIMI I LIMITATION FROM ORIGINAL APPLICATION ENTERED Loading...
Dec 5, 2019 REPR M SN ASSIGNED FOR SECT 66A APPL FROM IB Loading...

Detailed Classifications

Class 009
Laboratory apparatus and instruments, namely, microscopes; measuring or testing machines and instruments, namely, resistance meters; X-ray apparatus not for medical purposes; measuring apparatus and instruments, namely, reflectometers; surveying apparatus and instruments, namely, surveying machines and instruments; optical inspection apparatus for industrial use; semiconductor testing apparatus; spectrophotometers; metal detectors; X-ray fluorescence analyzers; apparatus and instruments for scanning ion microscopy, namely, electron microscopes; apparatus and instruments for scanning probe microscopy, namely, electron microscopes; radiation measuring apparatus; nano particle size analyzer

Additional Information

Translation
The wording "XHEMIS" has no meaning in a foreign language.

Classification

International Classes
009