Legal Representation
Attorney
Jeffrey H. Handelsman
USPTO Deadlines
Next Deadline
227 days remaining
Section 8 (6-Year) Declaration Due (Based on registration date 2020-03-17)
Due Date
March 17, 2026
Grace Period Ends
September 17, 2026
Additional deadlines exist. Contact your attorney for complete deadline information.
Application History
26 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Jul 7, 2025 | NA71 | E | NOTICE OF ACCEPTANCE OF SEC. 71 - E-MAILED | Loading... |
Jul 7, 2025 | 71AG | O | REGISTERED-SEC.71 ACCEPTED | Loading... |
Jul 2, 2025 | APRE | A | CASE ASSIGNED TO POST REGISTRATION PARALEGAL | Loading... |
Mar 31, 2025 | ES71 | I | TEAS SECTION 71 RECEIVED | Loading... |
Mar 17, 2025 | REM3 | E | COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED | Loading... |
Nov 15, 2024 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
Nov 15, 2024 | CHAN | I | APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED | Loading... |
Nov 15, 2024 | ECDR | I | TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS | Loading... |
Nov 15, 2024 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
Nov 15, 2024 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
Nov 15, 2024 | COAR | I | TEAS CHANGE OF OWNER ADDRESS RECEIVED | Loading... |
May 15, 2020 | GPNX | P | NOTIFICATION PROCESSED BY IB | Loading... |
Apr 28, 2020 | FIMP | P | FINAL DISPOSITION PROCESSED | Loading... |
Apr 28, 2020 | FICS | P | FINAL DISPOSITION NOTICE SENT TO IB | Loading... |
Apr 16, 2020 | GPAR | P | GRANT OF PROTECTION CREATED, TO BE SENT TO IB | Loading... |
Mar 17, 2020 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
Jan 4, 2020 | GPNX | P | NOTIFICATION PROCESSED BY IB | Loading... |
Dec 31, 2019 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
Dec 18, 2019 | OPNS | P | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | Loading... |
Dec 18, 2019 | OP2R | P | NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB | Loading... |
Dec 11, 2019 | NPUB | O | NOTICE OF PUBLICATION | Loading... |
Nov 25, 2019 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
Nov 12, 2019 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Oct 22, 2019 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
Oct 18, 2019 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
Oct 17, 2019 | REPR | M | SN ASSIGNED FOR SECT 66A APPL FROM IB | Loading... |
Detailed Classifications
Class 009
Instruments for measuring the curvature of a substrate on which a thin film is deposited or on which a vacuum treatment is carried out by a physical or chemical process, the substrate in question being a wafer of a metallic or semiconductor element, these instruments being used for in situ monitoring of the growth of the thin film in real time
Additional Information
Pseudo Mark
EASY-CURVE
Classification
International Classes
009