Legal Representation
Attorney
Mainak H. Mehta
USPTO Deadlines
Next Deadline
1197 days remaining
Section 71 Renewal Due (Principal Register 66a) (Based on registration date 20190514)
Due Date
May 14, 2029
Grace Period Ends
November 14, 2029
Application History
19 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Nov 12, 2025 | NA75 | E | NOTICE OF ACCEPTANCE OF SEC. 71 & 15 - E-MAILED | Loading... |
| Nov 12, 2025 | C75A | O | REGISTERED - SEC. 71 ACCEPTED & SEC. 15 ACK. | Loading... |
| Nov 3, 2025 | APRE | A | CASE ASSIGNED TO POST REGISTRATION PARALEGAL | Loading... |
| Jul 10, 2025 | ES75 | I | TEAS SECTION 71 & 15 RECEIVED | Loading... |
| Jul 26, 2019 | GPNX | P | NOTIFICATION PROCESSED BY IB | Loading... |
| Jul 8, 2019 | FICS | P | FINAL DISPOSITION NOTICE SENT TO IB | Loading... |
| Jul 8, 2019 | FIMP | P | FINAL DISPOSITION PROCESSED | Loading... |
| Jun 13, 2019 | GPAR | P | GRANT OF PROTECTION CREATED, TO BE SENT TO IB | Loading... |
| May 14, 2019 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
| Feb 26, 2019 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| Feb 22, 2019 | GPNX | P | NOTIFICATION PROCESSED BY IB | Loading... |
| Feb 6, 2019 | OPNS | P | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | Loading... |
| Feb 6, 2019 | OP2R | P | NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB | Loading... |
| Feb 6, 2019 | NPUB | O | NOTICE OF PUBLICATION | Loading... |
| Jan 18, 2019 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
| Jan 14, 2019 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Jan 14, 2019 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jan 14, 2019 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
| Jan 3, 2019 | REPR | M | SN ASSIGNED FOR SECT 66A APPL FROM IB | Loading... |
Detailed Classifications
Class 009
Probes for scientific purposes; semiconductor testing apparatus; contact probes for testing semiconductors; probes for testing semiconductors; probes for testing printed circuit boards; probes for testing integrated circuits; probes for testing semiconductor integrated circuit boards; probes for testing circuit boards; parts of probes for testing printed circuit boards, namely, plungers and springs; testing apparatus for testing printed circuit boards; parts of testing apparatus for testing printed circuit boards, namely, plungers and spring; test adapters for testing printed circuit boards; test pins for testing printed circuit boards
Classification
International Classes
009