Legal Representation
Attorney
Danna J. Cotman
USPTO Deadlines
Next Deadline
1245 days remaining
Section 8 & 9 (10-Year) Renewal Due (Based on registration date 2019-02-05)
Due Date
February 05, 2029
Grace Period Ends
August 05, 2029
Application History
50 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Mar 27, 2025 | NA75 | E | NOTICE OF ACCEPTANCE OF SEC. 71 & 15 - E-MAILED | Loading... |
Mar 27, 2025 | C75P | O | REGISTERED - PARTIAL SEC. 71 ACCEPTED & SEC. 15 ACK. | Loading... |
Mar 21, 2025 | EROP | I | TEAS RESPONSE TO OFFICE ACTION-POST REG RECEIVED | Loading... |
Mar 18, 2025 | PR75 | O | POST REGISTRATION ACTION MAILED - SEC. 71 & 15 | Loading... |
Mar 17, 2025 | APRE | A | CASE ASSIGNED TO POST REGISTRATION PARALEGAL | Loading... |
Oct 24, 2024 | ES75 | I | TEAS SECTION 71 & 15 RECEIVED | Loading... |
Feb 5, 2024 | REM3 | E | COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED | Loading... |
Jul 1, 2021 | TCCA | I | TEAS CHANGE OF CORRESPONDENCE RECEIVED | Loading... |
Jul 1, 2021 | ECDR | I | TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS | Loading... |
Jul 1, 2021 | ARAA | I | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED | Loading... |
Jul 1, 2021 | REAP | I | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED | Loading... |
Jun 26, 2020 | ADCH | M | CHANGE OF NAME/ADDRESS REC'D FROM IB | Loading... |
Jun 12, 2020 | NREP | P | NEW REPRESENTATIVE AT IB RECEIVED | Loading... |
Jun 21, 2019 | FINO | P | FINAL DECISION TRANSACTION PROCESSED BY IB | Loading... |
May 31, 2019 | FICS | P | FINAL DISPOSITION NOTICE SENT TO IB | Loading... |
May 30, 2019 | FIMP | P | FINAL DISPOSITION PROCESSED | Loading... |
May 5, 2019 | FICR | P | FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB | Loading... |
Feb 5, 2019 | R.PR | A | REGISTERED-PRINCIPAL REGISTER | Loading... |
Jan 5, 2019 | OPNX | P | NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB | Loading... |
Dec 19, 2018 | OPNS | P | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | Loading... |
Dec 19, 2018 | OPNR | P | NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB | Loading... |
Nov 20, 2018 | NPUB | E | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | Loading... |
Nov 20, 2018 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
Nov 16, 2018 | GPNX | P | NOTIFICATION PROCESSED BY IB | Loading... |
Oct 31, 2018 | OPNS | P | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | Loading... |
Oct 31, 2018 | OP2R | P | NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB | Loading... |
Oct 31, 2018 | NONP | E | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | Loading... |
Oct 12, 2018 | CNSA | O | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
Oct 12, 2018 | GNEN | O | NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED | Loading... |
Oct 12, 2018 | GNEA | O | EXAMINERS AMENDMENT E-MAILED | Loading... |
Oct 12, 2018 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
Oct 12, 2018 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
Sep 11, 2018 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
Sep 10, 2018 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
Sep 10, 2018 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
Mar 8, 2018 | GNRN | O | NOTIFICATION OF NON-FINAL ACTION E-MAILED | Loading... |
Mar 8, 2018 | GNRT | O | NON-FINAL ACTION E-MAILED | Loading... |
Mar 8, 2018 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
Feb 14, 2018 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
Feb 13, 2018 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
Feb 13, 2018 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
Sep 1, 2017 | RFNP | P | REFUSAL PROCESSED BY IB | Loading... |
Aug 15, 2017 | RFCS | P | NON-FINAL ACTION MAILED - REFUSAL SENT TO IB | Loading... |
Aug 14, 2017 | RFRR | P | REFUSAL PROCESSED BY MPU | Loading... |
Jul 25, 2017 | RFCR | E | NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW | Loading... |
Jul 24, 2017 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
Jul 21, 2017 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
Jul 17, 2017 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Jul 17, 2017 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
Jul 13, 2017 | REPR | M | SN ASSIGNED FOR SECT 66A APPL FROM IB | Loading... |
Detailed Classifications
Class 009
Measuring apparatus and instruments in the nature of product material and structure burr height measurement systems, primarily consisting of scanners, line confocal imaging sensors and operating software; product material and structure roughness measurement systems primarily consisting of scanners, line confocal imaging sensors and operating software, and product material and structure surface measurement systems primarily consisting of scanners, line confocal imaging sensors and operating software; [ scientific apparatus, namely, observational and signalling devices for measurement and quality control in the field of material processing by laser; tracking and monitoring apparatus in the nature of laser scanners with optical 3D imaging for use in material testing and quality control and for use in optical industrial metrology systems, all of the foregoing used in the field of electronics, medical devices, metal industry, packaging and plastics industry, cable, wire and tube manufacturing, and systems integration for product and process quality control; motion detectors and electrical controlling devices; measuring, counting, alignment and calibrating instruments, namely, electronic devices for material testing of compression, strength and hardness of industrial materials, and electronic devices for quality control by laser scanners with optical 3D imaging and quality control by optical industrial metrology systems, all of the foregoing used in the field of electronics, medical devices, metal industry, packaging and plastics industry, cable, wire and tube manufacturing, and systems integration for product and process quality control; ] testing and quality control devices in the nature of laser scanners with optical 3D imaging for use in material testing and quality control and for use in optical industrial metrology systems, all of the foregoing used in the field of electronics, medical devices, metal industry, packaging and plastics industry, cable, wire and tube manufacturing, and systems integration for product and process quality control; topographic measuring apparatus for use in measuring surfaces; [ measuring apparatus for measuring topography surfaces; non-medical electronic imaging devices for industrial purposes in the fields of electronics, metal industry, of packaging and plastics industry, of cable, wire and tube manufacturing, and of systems integration for product and process quality control; software for use in and in connection with 3D laser scanners and printers for automated optical 3D imaging and metrology systems; computer firmware for use in and in connection with 3D laser scanners and printers for automated optical 3D imaging and metrology systems; ] measuring sensors for product and material structure burr height, for roughness and for surfaces measuring systems, not for medical use; [ measuring apparatus, namely, for product and material structure burr height measurement, for roughness measurement and for surface measurement; electronic measurement sensors for measuring product and material structure burr height, product and material structure roughness and product and material structure height levels; ] optical measurement apparatus for measuring product and material structure burr height, product and material structure roughness and product and material structure height levels; [ digital measuring apparatus in the nature of apparatus for measuring product and material structure burr height measurement, product and material structure roughness and product and material structure height levels; detectors for measuring electromagnetics; sensors for measuring industrial instruments, not for medical use; optical measuring components in the nature of sensors for measuring product and material structure, and lasers for measuring purposes; distance and dimension measuring instruments not for medical use; ] imaging apparatus, namely, 3D laser scanners for industrial inspection; [ electric monitoring apparatus for monitoring 3D laser scanners and printers for automated optical 3D imaging and metrology systems; sensors for use in controlling rotation; electric control apparatus for controlling 3D laser scanners and printers for automated optical 3D imaging and metrology systems; gauges for measuring physical quantities, namely, thickness, surfaces, levels, depths, gaps in spaces, diameters of materials and pressure of flow; surveying machines and instruments in the nature of plane tables; electrical measuring transducers; electronic testing equipment, namely, material testing apparatus for testing product quality in the nature of product and material structure; electric meters; acoustic meters; sound level meters; wireless electronic scales; resistance measuring instruments; apparatus for measuring thermal energy; hygrometers; electrical switch housings for use in measuring apparatus; sensors for measuring physical quantities of substances, not for medical use; polyethylene measuring cups; sensors for measuring optical and magnetic rotation, not for medical use; wire diameter measuring devices; ] non-medical image scanners for automated optical 3D imaging and use with metrology systems; optical scanners; 3D scanners; [ electronic scanners; luminescence scanners; biometric scanners; scanners for use in data processing equipment; digital graphic scanners; digital input and output scanners; Measurement apparatus in the nature of scanning probes for product structure and material burr height, roughness and surface measurement, other than for medical use; optical radiation-measuring instruments; optical radiation detectors; pressure transmitters; pressure sensors; electronic pressure sensor, namely, micro sensors for measurement of pressures; pressure indicators; pressure measuring apparatus; baroscopes for measuring the variations of atmospheric pressure; pressure recorders; ] optical apparatus and instruments, namely, 3D laser scanners for industrial inspection, [ and laser document printers for automated optical 3D imaging and for use in optical metrology systems, and optical character recognition apparatus; optical frequency metrology devices; ] optical measurement apparatus in the nature of product structure 3D laser scanners for automated optical 3D imaging and metrology systems; optical sensors; [ optical device to enhance optical measurements; optical readers; optical phase shifters; electronic device in the nature of optical beam deflectors for use in 3D laser scanners for automated optical 3D imaging and metrology systems; optical character readers; electronic and optical communications instruments and components, namely, optical seekers that target measurement changes in materials and surfaces; ] optical inspection apparatus for industrial use [ ; filters for optical devices; infrared optical apparatus, namely, infrared detection apparatus for use in and with 3D laser scanners for automated optical 3D imaging and for use in and with optical industrial metrology systems; scientific apparatus in the nature of optical detectors ]
Classification
International Classes
009