Legal Representation
Attorney
David Ehrlich
USPTO Deadlines
Application History
25 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Feb 22, 2006 | MAB1 | O | ABANDONMENT NOTICE MAILED - EXPRESS ABANDONMENT | Loading... |
| Feb 21, 2006 | CNEA | R | EXAMINERS AMENDMENT -WRITTEN | Loading... |
| Feb 21, 2006 | XAEC | I | EXAMINER'S AMENDMENT ENTERED | Loading... |
| Feb 21, 2006 | ABN1 | O | ABANDONMENT - EXPRESS MAILED | Loading... |
| Feb 1, 2006 | ACEC | I | AMENDMENT FROM APPLICANT ENTERED | Loading... |
| Jan 17, 2006 | I | PAPER RECEIVED | Loading... | |
| Jan 12, 2006 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Jul 12, 2005 | CNSI | S | INQUIRY AS TO SUSPENSION MAILED | Loading... |
| Jul 11, 2005 | CNSI | R | SUSPENSION INQUIRY WRITTEN | Loading... |
| Jul 8, 2005 | RCCK | S | SUSPENSION CHECKED - TO ATTORNEY FOR ACTION | Loading... |
| Dec 16, 2004 | CNSL | S | LETTER OF SUSPENSION MAILED | Loading... |
| Dec 15, 2004 | CNSL | R | SUSPENSION LETTER WRITTEN | Loading... |
| Dec 10, 2004 | TEME | I | TEAS/EMAIL CORRESPONDENCE ENTERED | Loading... |
| Dec 1, 2004 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Dec 1, 2004 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Nov 23, 2004 | CNSI | S | INQUIRY AS TO SUSPENSION MAILED | Loading... |
| Nov 22, 2004 | CNSI | R | SUSPENSION INQUIRY WRITTEN | Loading... |
| Oct 27, 2004 | RCCK | S | SUSPENSION CHECKED - TO ATTORNEY FOR ACTION | Loading... |
| Apr 8, 2004 | CNSL | S | LETTER OF SUSPENSION MAILED | Loading... |
| Mar 8, 2004 | I | PAPER RECEIVED | Loading... | |
| Mar 8, 2004 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Sep 5, 2003 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Sep 2, 2003 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Jul 9, 2003 | I | PAPER RECEIVED | Loading... | |
| Jul 9, 2003 | AMPX | I | APPLICANT AMENDMENT PRIOR TO EXAMINATION | Loading... |
Detailed Classifications
Class 009
Optical digital measuring systems sold as a unit for measuring critical dimensions,profile and film thickness in semiconductor manufacturing, comprising, namely, an electric light source, a spectroscopic elipsometry, reflectometry, computer hardware, critical dimensions metrology software and, profile and thickness semiconductor measurement software
First Use Anywhere:
0
First Use in Commerce:
0
Class 037
Repair, installation and maintenance of measuring apparatus; repair, installation and maintenance of computers, including CPU and peripheral equipment
First Use Anywhere:
0
First Use in Commerce:
0
Class 042
Consulting services relating to semiconductor manufacturing apparatus and flat panel display manufacturing apparatus; consulting services relating to operational and functional aspects of optical measuring machines and apparatus for measuring film thickness and size and shape of wafers, and for particle inspection; repair, installation and maintenance of computer programs and software
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009
037
042