EMIVIEW

Serial Number 78195575
606

Registration Progress

Application Filed
Dec 17, 2002
Under Examination
Dec 23, 2003
Approved for Publication
Sep 10, 2003
Published for Opposition
Sep 30, 2003
Registered

Re-Apply for This Trademark

This trademark is no longer active. You may be able to file a new application for the same or similar mark.
Mark: EMIVIEW
Previous Owner: Optonics, Inc.
Classes: 009

Trademark Image

EMIVIEW

Basic Information

Serial Number
78195575
Filing Date
December 17, 2002
Published for Opposition
September 30, 2003
Abandonment Date
June 24, 2004
Drawing Code
1000

Status Summary

Current Status
Inactive
Status Code
606
Status Date
Jun 24, 2004
Classes
009

Rights Holder

Optonics, Inc.

03
Address
2593 Coast Avenue, Suite 100
Mountain View, CA 94043

Ownership History

Optonics, Inc.

Original Applicant
03
Mountain View, CA

Optonics, Inc.

Owner at Publication
03
Mountain View, CA

Legal Representation

Attorney
Joseph Bach

USPTO Deadlines

No Upcoming Deadlines

No upcoming deadlines found for this trademark.

Application History

10 events
Date Code Type Description Documents
Sep 2, 2004 ABN6 S ABANDONMENT - NO USE STATEMENT FILED Loading...
Dec 23, 2003 NOAM O NOA MAILED - SOU REQUIRED FROM APPLICANT Loading...
Sep 30, 2003 PUBO A PUBLISHED FOR OPPOSITION Loading...
Sep 10, 2003 NPUB O NOTICE OF PUBLICATION Loading...
Aug 9, 2003 CNSA P APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Jul 5, 2003 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Jul 15, 2003 CFIT O CASE FILE IN TICRS Loading...
Jul 5, 2003 TROA I TEAS RESPONSE TO OFFICE ACTION RECEIVED Loading...
Jul 3, 2003 GNRT F NON-FINAL ACTION E-MAILED Loading...
Jun 17, 2003 DOCK D ASSIGNED TO EXAMINER Loading...

Detailed Classifications

Class 009
Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely, Integrated Circuit (IC) design verification, debug, and failure analysis systems; automated test equipment (ATE); backside device imaging; photon timing systems; temperature mapping systems; and emission detection systems, all for measuring the performance characteristics of semiconductors
First Use Anywhere: 0
First Use in Commerce: 0

Additional Information

Pseudo Mark
EMISSION VIEW

Classification

International Classes
009