Legal Representation
Attorney
Joseph Bach
USPTO Deadlines
Application History
6 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jan 27, 2004 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| May 20, 2003 | CNFR | O | FINAL REFUSAL MAILED | Loading... |
| Mar 25, 2003 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Mar 25, 2003 | TROA | I | TEAS RESPONSE TO OFFICE ACTION RECEIVED | Loading... |
| Jan 14, 2003 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Dec 31, 2002 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
LABORATORY AND MANUFACTURING EQUIPMENT FOR USE WITH SEMICONDUCTOR ANALYSIS, NAMELY, MICROSCOPES, IMAGE ANALYZERS AND STRUCTURAL PARTS THEREFOR; SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBERS OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR; WAFER INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR INTEGRATED CIRCUIT TESTING EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE WAFER TESTING EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; COMPUTER HARDWARE AND SOFTWARE FOR SCANNING, IMAGING, INSPECTING DIAGNOSING AND TESTING WAFERS AND SEMICONDUCTOR INTEGRATED CIRCUITS
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009