RUDOLPH

Serial Number 77189724
Registration 3444029
800

Registration Progress

Application Filed
May 24, 2007
Under Examination
Approved for Publication
Mar 5, 2008
Published for Opposition
Mar 25, 2008
Registered
Jun 10, 2008

Trademark Image

RUDOLPH

Basic Information

Serial Number
77189724
Registration Number
3444029
Filing Date
May 24, 2007
Registration Date
June 10, 2008
Published for Opposition
March 25, 2008
Renewal Date
June 10, 2018
Drawing Code
4000

Status Summary

Current Status
Active
Status Code
800
Status Date
Apr 19, 2018
Registration
Registered
Classes
009

Rights Holder

ONTO INNOVATION INC.

03
Address
16 JONSPIN ROAD
WILMINGTON, MA 01887

Ownership History

Rudolph Technologies, Inc.

Original Applicant
03
Bloomington, MN

Rudolph Technologies, Inc.

Owner at Publication
03
Bloomington, MN

Rudolph Technologies, Inc.

Original Registrant
03
Wilmington, MA

ONTO INNOVATION INC.

New Owner After Registration #1
03
WILMINGTON, MA

Legal Representation

Attorney
Heather J. Kliebenstein

USPTO Deadlines

Next Deadline
1054 days remaining
Section 8 & 9 (20-Year) Renewal Due (Based on registration date 2008-06-10)
Due Date
June 10, 2028
Grace Period Ends
December 10, 2028

Application History

31 events
Date Code Type Description Documents
Oct 28, 2020 ASGN I AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP Loading...
May 12, 2020 COAR I TEAS CHANGE OF OWNER ADDRESS RECEIVED Loading...
May 12, 2020 REAP I TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED Loading...
May 12, 2020 ARAA I ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED Loading...
May 12, 2020 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
May 12, 2020 CHAN I APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Loading...
Apr 19, 2018 89AG O REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED Loading...
Apr 19, 2018 RNL1 Q REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS) Loading...
Apr 19, 2018 NA89 E NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED Loading...
Apr 18, 2018 APRE A CASE ASSIGNED TO POST REGISTRATION PARALEGAL Loading...
Apr 6, 2018 E89R I TEAS SECTION 8 & 9 RECEIVED Loading...
Jun 10, 2017 REM2 E COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED Loading...
Aug 15, 2013 APRE A CASE ASSIGNED TO POST REGISTRATION PARALEGAL Loading...
Aug 15, 2013 C15A O REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. Loading...
Aug 15, 2013 NA85 E NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED Loading...
Jul 31, 2013 E815 I TEAS SECTION 8 & 15 RECEIVED Loading...
Jul 31, 2013 815F I REGISTERED - SEC. 8 (6-YR) & SEC. 15 FILED Loading...
Jun 10, 2008 R.PR A REGISTERED-PRINCIPAL REGISTER Loading...
Mar 25, 2008 PUBO A PUBLISHED FOR OPPOSITION Loading...
Mar 5, 2008 NPUB O NOTICE OF PUBLICATION Loading...
Feb 19, 2008 ALIE A ASSIGNED TO LIE Loading...
Feb 19, 2008 PREV O LAW OFFICE PUBLICATION REVIEW COMPLETED Loading...
Jan 17, 2008 CNSA O APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Dec 27, 2007 TROA I TEAS RESPONSE TO OFFICE ACTION RECEIVED Loading...
Dec 27, 2007 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Dec 27, 2007 TEME I TEAS/EMAIL CORRESPONDENCE ENTERED Loading...
Jul 5, 2007 CNRT R NON-FINAL ACTION WRITTEN Loading...
Jul 5, 2007 GNRT F NON-FINAL ACTION E-MAILED Loading...
Jul 5, 2007 GNRN O NOTIFICATION OF NON-FINAL ACTION E-MAILED Loading...
Jun 29, 2007 DOCK D ASSIGNED TO EXAMINER Loading...
May 31, 2007 NWAP I NEW APPLICATION ENTERED Loading...

Detailed Classifications

Class 009
METROLOGY INSPECTION SYSTEMS COMPRISED OF ONE OR MORE LIGHT SOURCES, ONE OR MORE CAMERAS AND/OR SENSORS IN COMMUNICATION WITH COMPUTER SOFTWARE AND HARDWARE USED FOR THE MEASUREMENT OF THICKNESSES, ADHESION PROPERTIES, AND STRUCTURAL PROPERTIES OF SEMICONDUCTOR MATERIALS AND FOR MONITORING THE PERFORMANCE OF SEMICONDUCTOR FABRICATION PROCESSES; INSPECTION EQUIPMENT AND ASSOCIATED SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, OPTICAL INSPECTION EQUIPMENT FOR 2D AND 3D INSPECTION OF SEMICONDUCTOR MATERIALS; AND SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, SOFTWARE FOR IDENTIFYING DEFECTS IN SEMICONDUCTOR STRUCTURES, SOFTWARE FOR IDENTIFYING SEMICONDUCTOR FABRICATION PROCESS EXCURSIONS, SOFTWARE FOR RECORDING AND REVIEWING DEFECTS IN SEMICONDUCTORS STRUCTURES, SOFTWARE FOR IDENTIFYING ROOT CAUSES OF DEFECTS IN SEMICONDUCTOR STRUCTURES, AND SOFTWARE FOR CONTROLLING AND MONITORING SEMICONDUCTOR FABRICATION EQUIPMENT
First Use Anywhere: Dec 31, 1930
First Use in Commerce: Dec 31, 1930

Classification

International Classes
009