Legal Representation
Attorney
JAMES D. WELCH
USPTO Deadlines
Application History
13 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jul 21, 2010 | MAB2 | O | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | Loading... |
| Jul 20, 2010 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Dec 10, 2009 | CNFR | O | FINAL REFUSAL MAILED | Loading... |
| Dec 10, 2009 | CNFR | R | FINAL REFUSAL WRITTEN | Loading... |
| Nov 20, 2009 | ACEC | I | AMENDMENT FROM APPLICANT ENTERED | Loading... |
| Nov 20, 2009 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Nov 19, 2009 | ALIE | A | ASSIGNED TO LIE | Loading... |
| Nov 9, 2009 | I | PAPER RECEIVED | Loading... | |
| Jun 17, 2009 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Jun 17, 2009 | CNRT | R | NON-FINAL ACTION WRITTEN | Loading... |
| Jun 11, 2009 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Mar 31, 2009 | MAFR | O | APPLICATION FILING RECEIPT MAILED | Loading... |
| Mar 26, 2009 | NWOS | I | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | Loading... |
Detailed Classifications
Class 009
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009