RQ GARNET

Serial Number 76391623
606

Registration Progress

Application Filed
Apr 4, 2002
Under Examination
Oct 7, 2003
Approved for Publication
Jun 25, 2003
Published for Opposition
Jul 15, 2003
Registered

Trademark Image

RQ GARNET

Basic Information

Serial Number
76391623
Filing Date
April 4, 2002
Published for Opposition
July 15, 2003
Abandonment Date
October 8, 2004
Drawing Code
1000

Status Summary

Current Status
Inactive
Status Code
606
Status Date
Oct 8, 2004
Classes
009

Rights Holder

KONINKLIJKE PHILIPS ELECTRONICS N.V.

03
Address
Groenewoudseweg 1
Eindhoven
NL

Ownership History

KONINKLIJKE PHILIPS ELECTRONICS N.V.

Original Applicant
03
Eindhoven NL

KONINKLIJKE PHILIPS ELECTRONICS N.V.

Owner at Publication
03
Eindhoven NL

Legal Representation

Attorney
Ernestine C. Bartlett

USPTO Deadlines

All Deadlines Cleared

All 3 deadline(s) have been cleared by subsequent events. No active deadlines at this time.

Application History

17 events
Date Code Type Description Documents
Jan 26, 2005 ABN6 S ABANDONMENT - NO USE STATEMENT FILED Loading...
Jan 26, 2005 MAB6 O ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED Loading...
Sep 13, 2004 MAIL I PAPER RECEIVED Loading...
Apr 22, 2004 EX1G S EXTENSION 1 GRANTED Loading...
Apr 16, 2004 CFIT O CASE FILE IN TICRS Loading...
Apr 8, 2004 MAIL I PAPER RECEIVED Loading...
Apr 6, 2004 EXT1 S EXTENSION 1 FILED Loading...
Oct 7, 2003 NOAM O NOA MAILED - SOU REQUIRED FROM APPLICANT Loading...
Jul 15, 2003 PUBO A PUBLISHED FOR OPPOSITION Loading...
Jun 25, 2003 NPUB O NOTICE OF PUBLICATION Loading...
May 5, 2003 CNSA P APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Feb 25, 2003 MAIL I PAPER RECEIVED Loading...
Feb 25, 2003 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Feb 21, 2003 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Dec 17, 2002 DOCK D ASSIGNED TO EXAMINER Loading...
Aug 22, 2002 CNRT F NON-FINAL ACTION MAILED Loading...
Jul 26, 2002 DOCK D ASSIGNED TO EXAMINER Loading...

Detailed Classifications

Class 009
Laser ellipsometry metrology apparatus, namely, laser ellipsometers and laser reflectometers used in silicon and the compound semiconductor industry, x-ray fluorescence analyzers and testers for discs and wafers
First Use Anywhere: 0
First Use in Commerce: 0

Classification

International Classes
009