Legal Representation
Attorney
Ernestine C. Bartlett
USPTO Deadlines
Application History
17 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Jan 26, 2005 | ABN6 | S | ABANDONMENT - NO USE STATEMENT FILED | Loading... |
Jan 26, 2005 | MAB6 | O | ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED | Loading... |
Sep 13, 2004 | I | PAPER RECEIVED | Loading... | |
Apr 22, 2004 | EX1G | S | EXTENSION 1 GRANTED | Loading... |
Apr 16, 2004 | CFIT | O | CASE FILE IN TICRS | Loading... |
Apr 8, 2004 | I | PAPER RECEIVED | Loading... | |
Apr 6, 2004 | EXT1 | S | EXTENSION 1 FILED | Loading... |
Oct 7, 2003 | NOAM | O | NOA MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
Jul 15, 2003 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
Jun 25, 2003 | NPUB | O | NOTICE OF PUBLICATION | Loading... |
May 5, 2003 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
Feb 25, 2003 | I | PAPER RECEIVED | Loading... | |
Feb 25, 2003 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
Feb 21, 2003 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
Dec 17, 2002 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Aug 22, 2002 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
Jul 26, 2002 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
Laser ellipsometry metrology apparatus, namely, laser ellipsometers and laser reflectometers used in silicon and the compound semiconductor industry, x-ray fluorescence analyzers and testers for discs and wafers
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009