Legal Representation
Attorney
JUDSON K. CHAMPLIN
USPTO Deadlines
Application History
7 eventsDate | Code | Type | Description | Documents |
---|---|---|---|---|
Nov 23, 2003 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
Apr 3, 2003 | CNRT | O | NON-FINAL ACTION MAILED | Loading... |
Dec 16, 2002 | I | PAPER RECEIVED | Loading... | |
Dec 16, 2002 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
Jul 16, 2002 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
May 28, 2002 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Apr 30, 2002 | I | PAPER RECEIVED | Loading... |
Detailed Classifications
Class 009
OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THERE FOR, NAMELY, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009