CYBEROPTICS

Serial Number 76169157
Registration 2611877
800

Registration Progress

Application Filed
Nov 21, 2000
Under Examination
Approved for Publication
May 15, 2002
Published for Opposition
Jun 4, 2002
Registered
Aug 27, 2002

Trademark Image

CYBEROPTICS

Basic Information

Serial Number
76169157
Registration Number
2611877
Filing Date
November 21, 2000
Registration Date
August 27, 2002
Published for Opposition
June 4, 2002
Renewal Date
August 27, 2022
Drawing Code
1

Status Summary

Current Status
Active
Status Code
800
Status Date
Mar 25, 2022
Registration
Registered
Classes
009

Rights Holder

CyberOptics Corporation

03
Address
5900 Golden Hills Drive
Golden Valley, MN 55416

Ownership History

CyberOptics Corporation

Original Applicant
03
Golden Valley, MN

CyberOptics Corporation

Owner at Publication
03
Golden Valley, MN

CyberOptics Corporation

Original Registrant
03
Golden Valley, MN

Legal Representation

Attorney
Brittany L. Kulwicki

USPTO Deadlines

Next Deadline
2586 days remaining
Section 8 & 9 (30-Year) Renewal Due (Based on registration date 2002-08-27)
Due Date
August 27, 2032
Grace Period Ends
February 27, 2033

Application History

28 events
Date Code Type Description Documents
Feb 15, 2023 CHAN I APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Loading...
Feb 15, 2023 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
Feb 15, 2023 COAR I TEAS CHANGE OF OWNER ADDRESS RECEIVED Loading...
Feb 15, 2023 REAP I TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED Loading...
Feb 15, 2023 ARAA I ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED Loading...
Mar 25, 2022 NA89 E NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED Loading...
Mar 25, 2022 RNL2 Q REGISTERED AND RENEWED (SECOND RENEWAL - 10 YRS) Loading...
Mar 25, 2022 89AG O REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED Loading...
Mar 25, 2022 APRE A CASE ASSIGNED TO POST REGISTRATION PARALEGAL Loading...
Nov 18, 2021 E89R I TEAS SECTION 8 & 9 RECEIVED Loading...
Aug 27, 2021 REM2 E COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED Loading...
Dec 4, 2019 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
Jun 19, 2012 NA89 E NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED Loading...
Jun 19, 2012 RNL1 Q REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS) Loading...
Jun 19, 2012 89AG O REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED Loading...
Jun 14, 2012 E89R I TEAS SECTION 8 & 9 RECEIVED Loading...
Jul 29, 2008 C15A O REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. Loading...
Jul 8, 2008 E815 I TEAS SECTION 8 & 15 RECEIVED Loading...
Nov 28, 2007 CFIT O CASE FILE IN TICRS Loading...
May 26, 2005 TCCA I TEAS CHANGE OF CORRESPONDENCE RECEIVED Loading...
Aug 27, 2002 R.PR A REGISTERED-PRINCIPAL REGISTER Loading...
Jun 4, 2002 PUBO A PUBLISHED FOR OPPOSITION Loading...
May 15, 2002 NPUB O NOTICE OF PUBLICATION Loading...
Feb 22, 2002 CNSA O APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Feb 19, 2002 CNEA O EXAMINERS AMENDMENT MAILED Loading...
Dec 19, 2001 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Jun 20, 2001 CNRT F NON-FINAL ACTION MAILED Loading...
Apr 27, 2001 DOCK D ASSIGNED TO EXAMINER Loading...

Detailed Classifications

Class 009
Optical based measurement devices for use in ascertaining the surface features, contour, or shape of an object; optical sensors for high speed dimensional measurements of precision parts; optical sensors for assembling electronics; non-contact optical sensors for assembling electronics; solder paste inspection systems for inspecting and measuring solder paste on circuit boards and software therefor, namely, optical sensors, and associated computer hardware and software; non-contact inspection systems comprised of an optical sensor with a light source, lenses and optical detectors for three-dimensional measurement, used during the manufacturing process of precision parts; machine vision systems comprising component optical sensors and computer hardware and software; manufacturing devices, namely, optical sensors for use in component placement and inspection systems; optical wafer mapping sensors for detecting wafers in wafer processing systems
First Use Anywhere: Aug 29, 1989
First Use in Commerce: Aug 29, 1989

Classification

International Classes
009