Legal Representation
Attorney
John A Mizhir
USPTO Deadlines
Application History
10 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| May 24, 2003 | ABN6 | S | ABANDONMENT - NO USE STATEMENT FILED | Loading... |
| Aug 27, 2002 | NOAM | O | NOA MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Jun 4, 2002 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| May 15, 2002 | NPUB | O | NOTICE OF PUBLICATION | Loading... |
| Mar 5, 2002 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Sep 17, 2001 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Sep 17, 2001 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Mar 15, 2001 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Mar 12, 2001 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Mar 8, 2001 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
MICRO-OPTICAL COMPONENTS, NAMELY, LENSES, BALL LENSES, LENS ARRAYS, MIRRORS, PRISMS, BEAM SPLITTERS, FIBER OPTIC ARRAYS, COLLIMATORS, COLLIMATOR ARRAYS FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; MICRO-BALL LENSES AND MICRO-LENSES FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS; MICRO-OPTICAL ASSEMBLIES, AND FIBER OPTIC ASSEMBLIES FOR USE IN OPTICAL NETWORKS; MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS FOR USE IN THE MEASUREMENT OF DEVIATION OF SURFACE SHAPE; DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; ATMOSPHERIC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT PROVIDING NON-CONTAMINATED HANDS-OFF RETICLE MEASUREMENT AND INSPECTION; IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT FOR USE IN PRECISION MEASUREMENT OF SILICON WAFER TOPOGRAPHY; OPTICAL DATA STORAGE HEADS AND DRIVES; SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE HEADS AND SLIDERS; AND SURFACE EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE DISKS
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009