NANO SCANNER

Serial Number 76157149
606

Registration Progress

Application Filed
Oct 31, 2000
Under Examination
Apr 8, 2003
Approved for Publication
Dec 25, 2002
Published for Opposition
Jan 14, 2003
Registered

Trademark Image

NANO SCANNER

Basic Information

Serial Number
76157149
Filing Date
October 31, 2000
Published for Opposition
January 14, 2003
Abandonment Date
April 9, 2005
Drawing Code
1000

Status Summary

Current Status
Inactive
Status Code
606
Status Date
Apr 9, 2005
Classes
009

Rights Holder

Kabushiki Kaisha Tokyo Seimitsu

03
Address
9-7-1, Shimorenjaku
Mitaka-shi, Tokyo
JP

Ownership History

Kabushiki Kaisha Tokyo Seimitsu

Original Applicant
03
Mitaka-shi, Tokyo JP

Kabushiki Kaisha Tokyo Seimitsu

Owner at Publication
03
Mitaka-shi, Tokyo JP

Legal Representation

Attorney
Curtis B. Hamre

USPTO Deadlines

All Deadlines Cleared

All 3 deadline(s) have been cleared by subsequent events. No active deadlines at this time.

Application History

26 events
Date Code Type Description Documents
Sep 28, 2005 ABN6 S ABANDONMENT - NO USE STATEMENT FILED Loading...
Sep 28, 2005 MAB6 O ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED Loading...
Oct 1, 2004 EEXT I SOU TEAS EXTENSION RECEIVED Loading...
Oct 1, 2004 EXT3 S SOU EXTENSION 3 FILED Loading...
Oct 1, 2004 EX3G S SOU EXTENSION 3 GRANTED Loading...
Aug 11, 2004 CFIT O CASE FILE IN TICRS Loading...
Mar 25, 2004 EX2G S SOU EXTENSION 2 GRANTED Loading...
Mar 18, 2004 MAIL I PAPER RECEIVED Loading...
Mar 15, 2004 EXT2 S SOU EXTENSION 2 FILED Loading...
Oct 14, 2003 EX1G S SOU EXTENSION 1 GRANTED Loading...
Oct 6, 2003 EEXT I SOU TEAS EXTENSION RECEIVED Loading...
Oct 6, 2003 EXT1 S SOU EXTENSION 1 FILED Loading...
Apr 8, 2003 NOAM O NOA MAILED - SOU REQUIRED FROM APPLICANT Loading...
Jan 14, 2003 PUBO A PUBLISHED FOR OPPOSITION Loading...
Dec 25, 2002 NPUB O NOTICE OF PUBLICATION Loading...
Nov 21, 2002 CNEA O EXAMINERS AMENDMENT MAILED Loading...
Nov 21, 2002 CNSA P APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Oct 31, 2002 ZZZX Z PREVIOUS ALLOWANCE COUNT WITHDRAWN Loading...
Aug 26, 2002 DOCK D ASSIGNED TO EXAMINER Loading...
Aug 26, 2002 CNSA P APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Aug 22, 2002 DOCK D ASSIGNED TO EXAMINER Loading...
Aug 22, 2002 CNEA O EXAMINERS AMENDMENT MAILED Loading...
Feb 7, 2002 CNSL S LETTER OF SUSPENSION MAILED Loading...
Nov 2, 2001 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
May 4, 2001 CNRT F NON-FINAL ACTION MAILED Loading...
Apr 23, 2001 DOCK D ASSIGNED TO EXAMINER Loading...

Detailed Classifications

Class 009
Measuring machines for making wafer surface measurements for use in the manufacturing of semiconductors
First Use Anywhere: 0
First Use in Commerce: 0

Classification

International Classes
009

Disclaimers

The following terms have been disclaimed and are not claimed as part of the trademark:
General Disclaimer
"SCANNER"