TSK

Serial Number 76101266
606

Registration Progress

Application Filed
Aug 2, 2000
Under Examination
Feb 4, 2003
Approved for Publication
Oct 23, 2002
Published for Opposition
Nov 12, 2002
Registered

Trademark Image

TSK

Basic Information

Serial Number
76101266
Filing Date
August 2, 2000
Published for Opposition
November 12, 2002
Abandonment Date
February 5, 2006
Drawing Code
3000

Status Summary

Current Status
Inactive
Status Code
606
Status Date
Feb 5, 2006
Classes
007 009

Rights Holder

Kabushiki Kaisha Tokyo Seimitsu

03
Address
9-7-1, Shimorenjaku, Mitaka-shi
Tokyo
JP

Ownership History

Kabushiki Kaisha Tokyo Seimitsu

Original Applicant
03
Tokyo JP

Kabushiki Kaisha Tokyo Seimitsu

Owner at Publication
03
Tokyo JP

Legal Representation

Attorney
Curtis B. Hamre

USPTO Deadlines

All Deadlines Cleared

All 3 deadline(s) have been cleared by subsequent events. No active deadlines at this time.

Application History

30 events
Date Code Type Description Documents
Apr 11, 2006 ABN6 S ABANDONMENT - NO USE STATEMENT FILED Loading...
Apr 11, 2006 MAB6 O ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED Loading...
Aug 8, 2005 EX5G S SOU EXTENSION 5 GRANTED Loading...
Jul 29, 2005 EEXT I SOU TEAS EXTENSION RECEIVED Loading...
Jul 29, 2005 EXT5 S SOU EXTENSION 5 FILED Loading...
Feb 18, 2005 DPCC D DIVISIONAL PROCESSING COMPLETE Loading...
Feb 18, 2005 EX4G S SOU EXTENSION 4 GRANTED Loading...
Jan 31, 2005 MAIL I PAPER RECEIVED Loading...
Jan 31, 2005 DRRR I DIVISIONAL REQUEST RECEIVED Loading...
Jan 31, 2005 EXT4 S SOU EXTENSION 4 FILED Loading...
Sep 3, 2004 MAIL I PAPER RECEIVED Loading...
Aug 26, 2004 EX3G S SOU EXTENSION 3 GRANTED Loading...
Aug 9, 2004 MAIL I PAPER RECEIVED Loading...
Aug 4, 2004 CFIT O CASE FILE IN TICRS Loading...
Aug 4, 2004 EXT3 S SOU EXTENSION 3 FILED Loading...
Feb 6, 2004 MAIL I PAPER RECEIVED Loading...
Feb 3, 2004 EXT2 S SOU EXTENSION 2 FILED Loading...
Feb 3, 2004 EX2G S SOU EXTENSION 2 GRANTED Loading...
Oct 24, 2003 EX1G S SOU EXTENSION 1 GRANTED Loading...
Aug 4, 2003 MAIL I PAPER RECEIVED Loading...
Aug 4, 2003 EXT1 S SOU EXTENSION 1 FILED Loading...
Feb 4, 2003 NOAM O NOA MAILED - SOU REQUIRED FROM APPLICANT Loading...
Nov 12, 2002 PUBO A PUBLISHED FOR OPPOSITION Loading...
Oct 23, 2002 NPUB O NOTICE OF PUBLICATION Loading...
Mar 14, 2002 CNSA P APPROVED FOR PUB - PRINCIPAL REGISTER Loading...
Jan 10, 2002 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Aug 1, 2001 CRFA I CORRESPONDENCE RECEIVED IN LAW OFFICE Loading...
Feb 2, 2001 CNRT F NON-FINAL ACTION MAILED Loading...
Jan 26, 2001 DOCK D ASSIGNED TO EXAMINER Loading...
Jan 24, 2001 DOCK D ASSIGNED TO EXAMINER Loading...

Detailed Classifications

Class 007
Semiconductor manufacturing equipment, namely, semiconductor wafer scrubbing and washing machine, wire slicing machine, wafer slicing machines, slicing machines for non-silicon wafers, sliced wafer carbon emounting and cleaning machine, wafer probing machine, and chemical mechanical planarizers
First Use Anywhere: 0
First Use in Commerce: 0
Class 009
Precision measuring machines, namely, wafer thickness measuring machine, non-contact flatness measuring machine, digital length measuring machine, laser interference length measuring sensor, optical fiber laser interferometer measuring machine, three-dimensional measuring machine, contour measuring machine, coordinate measuring machines; data processing for coordinate measuring machines, machine control gauge, displacement sensor, electric micrometer, pneumatic micrometer; computer controlled discrete device tester; automatic die selector, namely, computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; electric or magnetic measuring instrument, namely, electric current or voltage detectors, magnetic measuring apparatus, namely, magnetic sensors, capacity measures; optical apparatus, namely, microscopes; electronic machines and instruments and their parts and fittings, namely, ultrasonic depth sounders; automatic distribution vending machines; network system comprised of computer hardware and software for wafer probing machines; wafer inspection units
First Use Anywhere: 0
First Use in Commerce: 0

Classification

International Classes
007 009