Legal Representation
Attorney
CHARLES L GAGNEBIN III
USPTO Deadlines
Application History
6 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Apr 10, 2000 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Aug 9, 1999 | CNFR | O | FINAL REFUSAL MAILED | Loading... |
| May 28, 1999 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Dec 7, 1998 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Nov 17, 1998 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Nov 3, 1998 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
Inspection of substrates, particularly a system for inspection of semiconductor wafers, and more particularly for measurement of wafer flatness and shape and for detecting and classifying surface defects
First Use Anywhere:
19960700
First Use in Commerce:
19960700
Classification
International Classes
009