Legal Representation
Attorney
CHARLES L GAGNEBIN III
USPTO Deadlines
Application History
6 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Mar 1, 2000 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Jun 30, 1999 | CNFR | O | FINAL REFUSAL MAILED | Loading... |
| May 20, 1999 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Nov 18, 1998 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Nov 5, 1998 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
| Oct 29, 1998 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
Substrate inspection system, comprising hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness, Bow Wrap and SORI, resistivity, conductivity and notch detection
First Use Anywhere:
19960700
First Use in Commerce:
19960700
Classification
International Classes
009