Legal Representation
Attorney
CHARLES L GAGNEBIN III
USPTO Deadlines
Application History
5 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Mar 1, 2000 | ABN2 | O | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | Loading... |
| Jun 30, 1999 | CNFR | O | FINAL REFUSAL MAILED | Loading... |
| May 13, 1999 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Nov 9, 1998 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Oct 29, 1998 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks
First Use Anywhere:
19960700
First Use in Commerce:
19960700
Classification
International Classes
009