Legal Representation
Attorney
WILLIAM M LEE JR
USPTO Deadlines
Application History
12 events| Date | Code | Type | Description | Documents |
|---|---|---|---|---|
| Jul 19, 2000 | ABN6 | S | ABANDONMENT - NO USE STATEMENT FILED | Loading... |
| Oct 3, 1999 | EX2G | S | SOU EXTENSION 2 GRANTED | Loading... |
| Sep 7, 1999 | EXT2 | S | SOU EXTENSION 2 FILED | Loading... |
| Apr 2, 1999 | EX1G | S | SOU EXTENSION 1 GRANTED | Loading... |
| Mar 4, 1999 | EXT1 | S | SOU EXTENSION 1 FILED | Loading... |
| Sep 8, 1998 | NOAM | O | NOA MAILED - SOU REQUIRED FROM APPLICANT | Loading... |
| Jun 16, 1998 | PUBO | A | PUBLISHED FOR OPPOSITION | Loading... |
| May 15, 1998 | NPUB | O | NOTICE OF PUBLICATION | Loading... |
| Mar 24, 1998 | CNSA | P | APPROVED FOR PUB - PRINCIPAL REGISTER | Loading... |
| Feb 9, 1998 | CRFA | I | CORRESPONDENCE RECEIVED IN LAW OFFICE | Loading... |
| Oct 6, 1997 | CNRT | F | NON-FINAL ACTION MAILED | Loading... |
| Sep 23, 1997 | DOCK | D | ASSIGNED TO EXAMINER | Loading... |
Detailed Classifications
Class 009
scanning electron microscopes, transmission electron microscopes, focused ion beam instruments, X-ray spectrometers, and parts for all the aforesaid goods
First Use Anywhere:
0
First Use in Commerce:
0
Class 037
installation and maintenance of scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers
First Use Anywhere:
0
First Use in Commerce:
0
Class 042
technical consultancy and advisory services relating to scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers
First Use Anywhere:
0
First Use in Commerce:
0
Classification
International Classes
009
037
042